Low frequency noise characterization and modeling of SiGe HBT featuring LASER annealing in a 55-nm CMOS node

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Authors: J. Elbeyrouthy, A. Vauthelin, B. Sagnes, F. Pascal, A.Hoffmann, M. Valenza, S. Haendler, A. Gauthier, P. Chevalier, D. Gloria

Journal title: 25th International Conference on Noise and Fluctuations - ICNF 2019

Journal publisher: ICNF 2019

Published year: 2019