MOM Capacitance Characterization in G-Band using On-wafer 3D-TRL Calibration

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Authors: A.A. Saadi, M. Margalef, S. Le Pilliet, C. Gaquiere, D. Gloria, C. Durand, P. Ferrari

Journal title: 2019 14th European Microwave Integrated Circuits Conference (EuMIC)

Journal publisher: IEEE

Published year: 2019

Published pages: 136-139

DOI identifier: 10.23919/eumic.2019.8909558

ISBN: 978-2-87487-056-9