TCAD simulation and assessment of anomalous deflection in measured S-parameters of SiGe HBTs in THz range

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Authors: Soumya Ranjan Panda, Sebastien Fregonese, Anjan Chakravorty, Thomas Zimmer

Journal title: 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-4

DOI identifier: 10.1109/bcicts45179.2019.8972760

ISBN: 978-1-7281-0586-4