Silicon Based Diode Noise Source Scaling For Noise Measurement Up To 325 GHz

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Authors: H. Ghanem, J-C. Azevedo-Goncalves, S. Lepilliet, D. Gloria, C. Gaquiere, F. Danneville, G. Ducournau

Journal title: 2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-2

DOI identifier: 10.1109/irmmw-thz.2019.8873929

ISBN: 978-1-5386-8285-2