In-Situ Calibration and De-Embedding Test Structure Design for SiGe HBT On-Wafer Characterization up to 500 GHz

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Authors: M. Cabbia, M. Deng, S. Fregonese, M. De Matos, D. Celi, T. Zimmer

Journal title: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-4

DOI identifier: 10.1109/arftg47584.2020.9071733

ISBN: 978-1-7281-2056-0