Measurement based accurate definition of the SOA edges for SiGe HBTs

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Authors: Mathieu Jaoul, Didier Celi, Cristell Maneux, Thomas Zimmer

Journal title: 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-4

DOI identifier: 10.1109/bcicts45179.2019.8972729

ISBN: 978-1-7281-0586-4