Premier banc de mesure load-pull hybride pour la caractérisation des transistors HBT en technologie BiCMOS 55 nm en bande G

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Authors: C. Maye, W. Aouimeur, G. Ducournau, D. Gloria, and C. Gaquière

Journal title: 21e Journées Nationales Microondes (JNM)

Journal publisher: Journées Nationales Microondes

Published year: 2019