Validation of Thermal Resistance Extracted From Measurements on Stripe Geometry SiGe HBTs

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Authors: Suresh Balanethiram, Rosario D'Esposito, Sebastien Fregonese, Anjan Chakravorty, Thomas Zimmer

Journal title: IEEE Transactions on Electron Devices

Journal number: 66/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 4151-4155

DOI identifier: 10.1109/ted.2019.2935012

ISSN: 0018-9383