TCAD and EM co-simulation method to verify SiGe HBT measurements up to 500 GHz

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Authors: Soumya Ranjan Panda, Sebastien Fregonese, Marina Deng, Anjan Chakravorty, Thomas Zimmer

Journal title: Solid-State Electronics

Journal number: 174

Journal publisher: Pergamon Press Ltd.

Published year: 2020

Published pages: 107915

DOI identifier: 10.1016/j.sse.2020.107915

ISSN: 0038-1101