Characterization of SiO2/4H-SiC Interfaces in 4H-SiC MOSFETs: A Review

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Authors: Patrick Fiorenza, Filippo Giannazzo, Fabrizio Roccaforte

Journal title: Energies

Journal number: 12/12

Journal publisher: Multidisciplinary Digital Publishing Institute (MDPI)

Published year: 2019

Published pages: 2310

DOI identifier: 10.3390/en12122310

ISSN: 1996-1073