Effects of parasitic phenomena in half bridge with Super Junction MOSFETs suitable for UAV

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Authors: Luigi Abbatelli, Angelo Raciti, Rosario Scollo, Giuseppe Mauromicale, Santi Agatino Rizzo, Alfio Scuto, Domenico Nardo, Nunzio Salerno, Giovanni Susinni

Journal title: 2019 AEIT International Annual Conference (AEIT)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-6

DOI identifier: 10.23919/aeit.2019.8893414

ISBN: 978-8-8872-3745-0