Characterization and Modeling of BTI in SiC MOSFETs

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Authors: D. Cornigli, A. N. Tallarico, S. Reggiani, C. Fiegna, E. Sangiorgi, L. Sanchez, C. Valdivieso, G. Consentino, F. Crupi

Journal title: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2019

Published pages: 82-85

DOI identifier: 10.1109/essderc.2019.8901761

ISBN: 978-1-7281-1539-9