Electron trapping at SiO 2 /4H-SiC interface probed by transient capacitance measurements and atomic resolution chemical analysis

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Authors: Patrick Fiorenza, Ferdinando Iucolano, Giuseppe Nicotra, Corrado Bongiorno, Ioannis Deretzis, Antonino La Magna, Filippo Giannazzo, Mario Saggio, Corrado Spinella, Fabrizio Roccaforte

Journal title: Nanotechnology

Journal number: 29/39

Journal publisher: Institute of Physics Publishing

Published year: 2018

Published pages: 395702

DOI identifier: 10.1088/1361-6528/aad129

ISSN: 0957-4484