Threshold Voltage Instability in SiC Power MOSFETs

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Authors: G. Consentino, E. Guevara, L. Sanchez, F. Crupi, S. Reggiani, G. Meneghesso

Journal title: Proc. of the PCIM European Conference 2019: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

Journal publisher: Proc. of the PCIM European Conference 2019

Published year: 2019