Dynamic Properties Of Ultra Low-Voltage Rail-to-Rail Comparator Designed In 130 nm CMOS Technology

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Authors: Lukas Nagy, Daniel Arbet, Martin Kovac, Miroslav Potocny, Michal Sovcik, Viera Stopjakova

Journal title: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-4

DOI identifier: 10.1109/ddecs50862.2020.9095746

ISBN: 978-1-7281-9938-2