Ultra Low-Voltage Rail-to-Rail Comparator Design in 130 nm CMOS Technology

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Authors: Lukas Nagy, Daniel Arbet, Martin Kovac, Miroslav Potocny, Viera Stopjakova

Journal title: 2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

Journal publisher: IEEE

Published year: 2019

Published pages: 1-6

DOI identifier: 10.1109/ddecs.2019.8724650

ISBN: 978-1-7281-0073-9