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Authors: Michal Šovčík, Martin Kováč, Daniel Arbet, Viera Stopjaková, Miroslav Potočný
Journal title: Microelectronics Reliability
Journal number: 80
Journal publisher: Elsevier BV
Published year: 2018
Published pages: 155-163
DOI identifier: 10.1016/j.microrel.2017.11.006
ISSN: 0026-2714