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Authors: Tobias Saalfeld, Markus Scholl, Christoph Beyerstedt, Ralf Wunderlich, Stefan Heinen
Journal title: 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Journal publisher: IEEE
Published year: 2018
Published pages: 225-228
DOI identifier: 10.1109/icecs.2018.8618055
ISBN: 978-1-5386-9562-3