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Authors: Tobias Saalfeld, Alexander Meyer, Eva Schulte Bocholt, Ralf Wunderlich, Stefan Heinen
Journal title: 2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)
Journal publisher: IEEE
Published year: 2018
Published pages: 125-128
DOI identifier: 10.1109/prime.2018.8430341
ISBN: 978-1-5386-5387-6