Performance Analysis Of Ultra Low-Voltage Rail-to-Rail Comparator In 130 nm CMOS Technology

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Authors: Lukas Nagy, Daniel Arbet, Martin Kovac, Miroslav Potocny, Michal Sovcik, Viera Stopjakova

Journal title: 2019 IEEE AFRICON

Journal publisher: IEEE

Published year: 2019

Published pages: 1-5

DOI identifier: 10.1109/africon46755.2019.9133843

ISBN: 978-1-7281-3289-1