Thermal Stress Reduction of Power MOSFET with Dynamic Gate Voltage Control and Circulation Current Injection in Electric Drive Application

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Lie Wang, Bas Vermulst, Jorge Duarte, Henk Huisman

Journal title: Electronics

Journal number: 9/12

Journal publisher: Power Electronics

Published year: 2020

Published pages: 2025

DOI identifier: 10.3390/electronics9122025

ISSN: 2079-9292