Mutation-Based Test-Case Generation with Ecdar

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Authors: Kim G. Larsen, Florian Lorber, Brian Nielsen, Ulrik M. Nyman

Journal title: 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Journal publisher: IEEE

Published year: 2017

Published pages: 319-328

DOI identifier: 10.1109/icstw.2017.60

ISBN: 978-1-5090-6676-6