Model-based, mutation-driven test case generation via heuristic-guided branching search

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Authors: Andreas Fellner, Willibald Krenn, Rupert Schlick, Thorsten Tarrach, Georg Weissenbacher

Journal title: Proceedings of the 15th ACM-IEEE International Conference on Formal Methods and Models for System Design - MEMOCODE '17

Journal publisher: ACM Press

Published year: 2017

Published pages: 56-66

DOI identifier: 10.1145/3127041.3127049

ISBN: 9781-450350938