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Authors: C. Laguna, M. Bernard, N. Bernier, D. Rouchon, N. Rochat, J. Garrione, A. Jannaud, E. Nolot, V. Meli, N. Castellani, C. Sabbione, G. Bourgeois, M. C. Cyrille, L. Militaru, A. Souifi, G. Navarro, E. Nowak
Journal title: 2021 IEEE International Memory Workshop (IMW)
Journal publisher: IEEE
Published year: 2021
Published pages: 1-4
DOI identifier: 10.1109/imw51353.2021.9439590
ISBN: 978-1-7281-8517-0