Phase-change memory electro-thermal analysis and engineering thanks to enhanced thermal confinement

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Authors: Anna Lisa Serra, Gauthier Lefevre, Olga Cueto, Guillaume Bourgeois, Marie Claire Cyrille, Gabriele Navarro, Etienne Nowak

Journal title: Solid-State Electronics

Journal number: 186

Journal publisher: Pergamon Press Ltd.

Published year: 2021

Published pages: 108111

DOI identifier: 10.1016/j.sse.2021.108111

ISSN: 0038-1101