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Authors: Corentin Pigot, Fabien Gilibert, Marina Reyboz, Marc Bocquet, Jean-Michel Portal
Journal title: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2018
Published pages: 190-193
DOI identifier: 10.1109/SISPAD.2018.8551654
ISBN: 978-1-5386-6790-3
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