Optimizing Programming Energy for Improved RRAM Reliability for High Endurance Applications

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Authors: Gilbert Sassine, Diego Alfaro Robayo, Cecile Nail, Jean-Francois Nodin, Jean Coignus, Gabriel Molas, Etienne Nowak

Journal title: 2018 IEEE International Memory Workshop (IMW)

Journal publisher: IEEE

Published year: 2018

Published pages: 1-4

DOI identifier: 10.1109/IMW.2018.8388843

ISBN: 978-1-5386-5247-3