A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory

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Authors: A. Rodriguez-Fernandez, J. Muñoz-Gorriz, J. Suñé, E. Miranda

Journal title: Microelectronics Reliability

Journal number: 88-90

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 142-146

DOI identifier: 10.1016/j.microrel.2018.06.120

ISSN: 0026-2714