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Authors: T. Francois, J. Coignus, L. Grenouillet, J.P. Barnes, N. Vaxelaire, J. Ferrand, I. Bottala-Gambetta, M. Gros-Jean, S. Jeannot, P. Boivin, P. Chiquet, M. Bocquet, E. Nowak, F. Gaillard
Journal title: 2019 IEEE 11th International Memory Workshop (IMW)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-4
DOI identifier: 10.1109/imw.2019.8739664
ISBN: 978-1-7281-0981-7