Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices

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Authors: Stefan Petzold, Alexander Zintler, Robert Eilhardt, Eszter Piros, Nico Kaiser, Sankaramangalam Ulhas Sharath, Tobias Vogel, Márton Major, Keith Patrick McKenna, Leopoldo Molina‐Luna, Lambert Alff

Journal title: Advanced Electronic Materials

Journal number: 5/10

Journal publisher: WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

Published year: 2019

Published pages: 1900484

DOI identifier: 10.1002/aelm.201900484

ISSN: 2199-160X