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Authors: F. Arnaud, P. Zuliani, J.P. Reynard, A. Gandolfo, F. Disegni, P. Mattavelli, E. Gomiero, G. Samanni, C. Jahan, R. Berthelon, O. Weber, E. Richard, V. Barral, A. Villaret, S. Kohler, J.C. Grenier, R. Ranica, C. Gallon, A. Souhaite, D. Ristoiu, L. Favennec, V. Caubet, S. Delmedico, N. Cherault, R. Beneyton, S. Chouteau, P.O. Sassoulas, A. Vernhet, Y. Le Friec, F. Domengie, L. Scotti, D. Pacelli, J.L
Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)
Journal number: 2018 IEEE International Electron Devices Meeting
Journal publisher: IEEE
Published year: 2018
Published pages: 18.4.1-18.4.4
DOI identifier: 10.1109/iedm.2018.8614595
ISBN: 978-1-7281-1987-8
- Not specified