Optimized Reading Window for Crossbar Arrays Thanks to Ge-Se-Sb-N-based OTS Selectors

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Authors: A. Verdy, M. Bernard, J. Garrione, G. Bourgeois, M. C. Cyrille, E. Nolot, N. Castellani, P. Noe, C. Socquet-Clerc, T. Magis, G. Sassine, G. Molas, G. Navarro, E. Nowak

Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)

Journal number: IEDM, San Francisco

Journal publisher: IEEE

Published year: 2018

Published pages: 37.4.1-37.4.4

DOI identifier: 10.1109/iedm.2018.8614686

ISBN: 978-1-7281-1987-8