Heavy Ion Radiation Effects on Hafnium Oxide-Based Resistive Random Access Memory

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Authors: Stefan Petzold, S. U. Sharath, Jonas Lemke, Erwin Hildebrandt, Christina Trautmann, Lambert Alff

Journal title: IEEE Transactions on Nuclear Science

Journal number: 66/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1715-1718

DOI identifier: 10.1109/tns.2019.2908637

ISSN: 0018-9499