Study on the Connection Between the Set Transient in RRAMs and the Progressive Breakdown of Thin Oxides

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Authors: Fernando Leonel Aguirre, Alberto Rodriguez-Fernandez, Sebastian Matias Pazos, Jordi Sune, Enrique Miranda, Felix Palumbo

Journal title: IEEE Transactions on Electron Devices

Journal number: 66/8

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 3349-3355

DOI identifier: 10.1109/TED.2019.2922555

ISSN: 0018-9383