Simple method for monitoring the switching activity in memristive cross-point arrays with line resistance effects

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Authors: E. Miranda, A. Morell, J. Muñoz-Gorriz, J. Suñé

Journal title: Microelectronics Reliability

Journal number: 100-101

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 113327

DOI identifier: 10.1016/j.microrel.2019.06.019

ISSN: 0026-2714