Reliability and Variability of 1S1R OxRAM-OTS for High Density Crossbar Integration

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Authors: D. Alfaro Robayo, G. Sassine, J. Minguet Lopez, L. Grenouillet, A. Verdy, G. Navarro, M. Bernard, E. Esmanhotto, C. Carabasse, E. Vianello, N. Castellani, L. Ciampolini, B. Giraud, C. Cagli, G. Guibaudo, E. Nowak, G. Molas

Journal publisher: IEEE

Published year: 2019

DOI identifier: 10.1109/iedm19573.2019.8993439