OxRAM for embedded solutions on advanced node: scaling perspectives considering statistical reliability and design constraints

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Authors: J. Sandrini, M. Barlas, J. F. Nodin, O. Billoint, G. Molas, R. Fournel, E. Nowak, F. Gaillard, C. Cagli, L. Grenouillet, V. Meli, N. Castellani, I. Hammad, S. Bernasconi, F. Aussenac, S. Van Duijn, G. Audoit

Journal title: 2019 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2019

Published pages: 30.5.1-30.5.4

DOI identifier: 10.1109/iedm19573.2019.8993484

ISBN: 978-1-7281-4032-2