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Authors: M. Lederer, T. Kämpfe, R. Olivo, D. Lehninger, C. Mart, S. Kirbach, T. Ali, P. Polakowski, L. Roy, and K. Seidel
Journal title: Appl. Phys. Lett.
Journal publisher: American Institute of Physics
Published year: 2019
DOI identifier: 10.1063/1.5129318
ISSN: 0003-6951