Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization

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Authors: J. Minguet Lopez, L. Hudeley, L. Grenouillet, D. Alfaro Robayo, J. Sandrini, G. Navarro, M. Bernard, C. Carabasse, D. Deleruyelle, N. Castellani, M. Bocquet, J. M. Portal, E. Nowak, G. Molas

Journal title: 2021 IEEE International Reliability Physics Symposium (IRPS)

Journal publisher: IEEE

Published year: 2021

Published pages: 1-6

DOI identifier: 10.1109/irps46558.2021.9405195

ISBN: 978-1-7281-6893-7