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Authors: Pablo Gutierrez Peon, Pedro Manuel Rodriguez, Zaloa Fernandez, Francisco Pozo, Elisabeth Uhlemann, Inaki Val, Wilfried Steiner
Journal title: 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-8
DOI identifier: 10.1109/ETFA.2017.8247602
ISBN: 978-1-5090-6505-9