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Authors: W.D. van Driel, B. Jacobs, D. Schenkelaars, M. Klompenhouwer, R. Poelma, B. El Mansouri, L.M. Middelburg
Journal title: 2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/EuroSimE.2017.7926293
ISBN: 978-1-5090-4344-6
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