Analyzing Computer Vision Data — The Good, the Bad and the Ugly

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Authors: Oliver Zendel, Katrin Honauer, Markus Murschitz, Martin Humenberger, Gustavo Fernandez Dominguez

Journal title: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

Journal publisher: IEEE

Published year: 2017

Published pages: 6670-6680

DOI identifier: 10.1109/CVPR.2017.706

ISBN: 978-1-5386-0457-1