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Authors: A. Kock, M. Deluca, F. Sosada-Ludwikowska, R. Wimmer-Teubenbacher, E. Lackner, K. Rohracher, E. Wachmann, J. S. Niehaus, S. Becker, S. Steinhauer, M. Sowwan, V. Singh, O. Tokmak
Journal title: 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-5
DOI identifier: 10.1109/asdam.2018.8544608
ISBN: 978-1-5386-7490-1
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