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Authors: Lei Zhu, Shuangke Liu, F. Allibert, E. Desbonnets, I. Radu, Xinen Zhu, Yumin Lu
Journal title: 2016 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
Journal publisher: IEEE
Published year: 2016
Published pages: 1-2
DOI identifier: 10.1109/VLSI-TSA.2016.7480530
ISBN: 978-1-4673-9478-9