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Authors: Yao Liu, Giovanni Mangraviti, Shinya Hitomi, Khaled Khalaf, Bjorn Debaillie, Piet Wambacq
Journal title: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal number: Date of Conference: 15-18 Oct. 2018
Journal publisher: IEEE
Published year: 2018
Published pages: 1-3
DOI identifier: 10.1109/s3s.2018.8640209
ISBN: 978-1-5386-7627-1