Hot-Carrier Degradation in Power LDMOS: Drain Bias Dependence and Lifetime Evaluation

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Authors: Andrea Natale Tallarico, Susanna Reggiani, Riccardo Depetro, Stefano Manzini, Andrea Mario Torti, Giuseppe Croce, Enrico Sangiorgi, Claudio Fiegna

Journal title: IEEE Transactions on Electron Devices

Journal number: 65/11

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 5195-5198

DOI identifier: 10.1109/ted.2018.2867650

ISSN: 0018-9383