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Authors: L. Cernaj, A. Chvala, J. Marek, D. Donova, T. Zavodnik, J. Kozarik, M. Jagelka, M. Donoval
Journal title: 2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-4
DOI identifier: 10.1109/ASDAM.2018.8544582
ISBN: 978-1-5386-7490-1
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