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Authors: Johannes Partzsch, Sebastian Hoppner, Matthias Eberlein, Rene Schuffny, Christian Mayr, David R. Lester, Steve Furber
Journal title: 2017 IEEE International Symposium on Circuits and Systems (ISCAS)
Journal publisher: IEEE
Published year: 2017
Published pages: 1-4
DOI identifier: 10.1109/ISCAS.2017.8050528
ISBN: 978-1-4673-6853-7