Modeling and design considerations for negative capacitance field-effect transistors

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Authors: Michael Hoffmann, Milan Pesic, Stefan Slesazeck, Uwe Schroeder, Thomas Mikolajick, Thomas Mikolajick

Journal title: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal number: 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-4

DOI identifier: 10.1109/ulis.2017.7962577

ISBN: 978-1-5090-5313-1