Automatic Test Generation for Energy Consumption of Embedded Systems Modeled in EAST-ADL

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Authors: Raluca Marinescu, Eduard Enoiu, Cristina Seceleanu, Daniel Sundmark

Journal title: 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)

Journal publisher: IEEE

Published year: 2017

Published pages: 69-76

DOI identifier: 10.1109/ICSTW.2017.19

ISBN: 978-1-5090-6676-6